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Automatic test pattern generation techniques for built-in self-test of digital circuits.

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Call No.	TK7874 .K34 1994
Author	Kagaris, Dimitrios N.
Title	Automatic test pattern generation techniques for built-in self-test of digital circuits.
Date	1994
Description	vii, 204 leaves : ill. 28 cm
Format	application/pdf
Subject	Digital integrated circuits -- Testing. Digital integrated circuits -- Testing -- Mathematical models. Digital integrated circuits -- Design and construction.
College	Dartmouth College -- Department of Mathematics and Computer Science.
Issuing Body	Dartmouth Dissertations are made available through the Dartmouth Digital Library.
Degree	Thesis (Ph.D.)--Dartmouth College.
Copyright	All rights reserved. No part of this book may be reproduced in any form by any electronic or mechanical means without permission in writing from the author.
DOI	http://dx.doi.org/10.1349/ddlp.1405

Title	Page 1
Full Text	AUTOMATIC TEST PATTERN GENERATION TECHNIQUES FOR BUILT-IN SELF-TEST OF DIGITAL CIRCUITS A Thesis Submitted to the Faculty of the Department of Mathematics and Computer Science in partial fulfillment of the requirements for the degree of Doctor of Philosophy in Computer Science by Dimitrios N. Kagaris DARTMOUTH COLLEGE Hanover, New Hampshire June 1994

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