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Implementation, characterization, and applications of a scanning Kelvin probe force microscope.

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Call No.	QH212.S32 H63 1995
Author	Hochwitz, Todd.
Title	Implementation, characterization, and applications of a scanning Kelvin probe force microscope.
Date	1995
Description	xvi, 305 leaves : ill.
Format	application/pdf
Subject	Scanning force microscopy. Scanning electron microscopes -- Design and construction. Semiconductors -- Analysis.
College	Thayer School of Engineering.
Issuing Body	Dartmouth Dissertations are made available through the Dartmouth Digital Library.
Degree	Thesis (Ph.D.)--Dartmouth College.
Copyright	All rights reserved. No part of this book may be reproduced in any form by any electronic or mechanical means without permission in writing from the author.
DOI	http://dx.doi.org/10.1349/ddlp.1508

Title	Page 1
Full Text	Implementation, Characterization, and Applications of a Scanning Kelvin Probe Force Microscope A Thesis Submitted to the Faculty in partial fulfillment of the requirements for the degree of Doctor of Philosophy by Todd Hochwitz Thayer School of Engineering Dartmouth College Hanover, New Hampshire December 1995

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